Enhanced resolution in subsurface near-field optical microscopy
نویسندگان
چکیده
منابع مشابه
Enhanced resolution in subsurface near-field optical microscopy.
We report an experimental analysis of the capabilities of scattering-type scanning near-field optical microscopy for mapping sub-surface features at varying depths. For the first time, we demonstrate experimentally that both the spatial resolution and depth contrast can be improved in subsurface microscopy by demodulating the measured near-field signal at higher harmonics of the probe's tapping...
متن کاملTip-enhanced near-field optical microscopy.
Spectroscopic methods with high spatial resolution are essential for understanding the physical and chemical properties of nanoscale materials, including quantum structures and biological surfaces. An optical technique is reviewed that relies on the enhanced electric fields in the proximity of a sharp, laser-irradiated metal tip. These fields are utilized for spatially confined probing of vario...
متن کاملApplications of field-enhanced near-field optical microscopy.
Metal nanostructures such as sharp tips can enhance emission yields through shape-induced local field enhancement. The enhancement originates from two mechanisms: surface plasmons and electrostatic lightening rod effects. We present fluorescence imaging using the strong local field created at the apex of a gold tip and demonstrate optical resolution of 25 nm. The enhancement effect gives also r...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملAn overview of scanning near-field optical microscopy in characterization of nano-materials
Scanning Near-Field Optical Microscopy (SNOM) is a member of scanning probe microscopes (SPMs) family which enables nanostructure investigation of the surfaces on a wide range of materials. In fact, SNOM combines the SPM technology to the optical microscopy and in this way provide a powerful tool to study nano-structures with very high spatial resolution. In this paper, a qualified overview of ...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
ژورنال
عنوان ژورنال: Optics Express
سال: 2011
ISSN: 1094-4087
DOI: 10.1364/oe.20.000593